Subsystem Test Set-Up Including BERT

Hittite Signal Generators are ideal low cost signal sources for all component and subsystem test that require the characterizations of gain, loss, isolation and freq uency translation measurements as indicated in the block diagram above. From 10 MHz to 20 GHz, 40 GHz, or 70 GHz the T2220, T2240 or T2270 optimizes instrument investment and productivity by conforming to the test frequency range and application required while minimizing the size and AC power requirements of the source. The Hittite signal generator features and capabilities particularly well suited for component and subsystem test applications are;

• The Hittite signal generators provide a versatile selection of accurate, high spectral purity RF synthesized sources for low cost characterization, test and evaluation applications ranging from narrow to broad band amplifier, switch, filter, attenuator etc. and other components, as well as converters and subsystems measurements.
• Simplified manual setup or computer driven frequency and amplitude list control reduces repetitive test time and costs. Since frequency and amplitude test points may be saved and reused as associated with different devices, test setup times are reduced as well.
• Exceptionally high RF output levels and wide dynamic range provide flexibility, and simplify most measurements by reducing or eliminating the need for external amplifiers or attenuators.
• When used as a source synthesizer for Bit Error Rate measurements, the Hittite signal generator provides a multi-purpose stimulus for sensitive and accurate system performance evaluations.
• Hittite signal generators provide a stable, accurate, triggerable and fast switching frequency source for antenna near field, far field and compact range measurements. The computer controlled frequency list mode feature expedites all forms of antenna characterizations from dish to steerable phased array.